Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-23T02:44:16.355Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Ping Lu ,
Lin Zhou ,
Jon Ihlefeld  and
Wei Pan
Ping Lu
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Lin Zhou
Affiliation:
Ames Laboratory, Ames, IA, USA
Jon Ihlefeld
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, USA
Wei Pan
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 66 - 67
Copyright
© Microscopy Society of America 2018 

References

[1] Yu, P., Chu, Y.-H. Ramesh, R. Mater. Today 15 2012) p. 320.Google Scholar
[2] Von Harrach, H.S., et al, Microsc. Microanal. 15(suppl.2 2009) p. 208.Google Scholar
[3] Lu, P., et al, Microsc. Microanal. 20 2014) p. 1782.Google Scholar
[4] Lu, P., et al, Sci. Rep. 4 2014) p. 3945.Google Scholar
[5] Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC, a wholly owned subsidiary of Honeywell International Inc., for the U. S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525. Authors thank Professors Q.X. Jia (University of Buffalo), H.Y. Wang (Purdue University) and J. L. MacManus-Driscoll (University of Cambridge (UK)) for providing the samples necessary for the work.Google Scholar