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Atomic-scale Structural Imaging of Interfacial Defects in GaAs(001)-based Heterostructures

Published online by Cambridge University Press:  30 July 2021

Abhinandan Gangopadhyay ,
Thomas J. Rotter ,
Ganesh Balakrishnan  and
David J Smith
Abhinandan Gangopadhyay
Affiliation:
Arizona State University, United States
Thomas J. Rotter
Affiliation:
University of New Mexico, United States
Ganesh Balakrishnan
Affiliation:
The University of New Mexico, United States
David J Smith
Affiliation:
Arizona State University, 85281, Arizona, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2356 - 2357
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

This work was supported by the National Science Foundation and the Department of Energy under NSF CA No. EEC-1041895. The authors acknowledge the use of facilities within the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University.Google Scholar