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Atomic-Scale Quantitative and Analytical STEM Investigation of Sr-δ-Doped La2CuO4 Multilayers

Published online by Cambridge University Press:  23 September 2015

Y. Wang ,
W. Sigle ,
D. Zhou ,
F. Baiutti ,
G. Logvenov ,
G. Gregori ,
G. Cristiani ,
J. Maier  and
P.A. van Aken
Y. Wang
Affiliation:
Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy, Stuttgart, Germany
W. Sigle
Affiliation:
Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy, Stuttgart, Germany
D. Zhou
Affiliation:
Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy, Stuttgart, Germany
F. Baiutti
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
G. Logvenov
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
G. Gregori
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
G. Cristiani
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
J. Maier
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
P.A. van Aken
Affiliation:
Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy, Stuttgart, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2071 - 2072
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Lee, P.A., et al., Rev.Mod.Phys 78 (2006). p. 17.Google Scholar
[2] Wells, B.O, et al., Science 277 (1997). p 1067.CrossRefGoogle Scholar
[3] Gozar, A, et al., Nature 455 (2008). p 782.Google Scholar
[4] Baiutti, F, et al., submitted (2015).Google Scholar
[5] The research leading to these results has received funding from the European Union Seventh Framework Program under Grant Agreement 312483-ESTEEM2 (Integrated Infrastructure Initiative I3). U. Salzberger is particularly acknowledged for TEM specimen preparation.Google Scholar