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Atomic-scale imaging of flexoelectric polarization around engineered crack tips

Published online by Cambridge University Press:  30 July 2021

Hongguang Wang ,
Hans Boschker ,
Xijie Jiang ,
Yi Wang ,
Robert Stark ,
Jochen Mannhart  and
Peter A. van Aken
Hongguang Wang*
Affiliation:
Max Planck Institute for Solid State Research, United States
Hans Boschker
Affiliation:
Max Planck Institute for Solid State Research, United States
Xijie Jiang
Affiliation:
Technische Universität. Darmstadt, United States
Yi Wang
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
Robert Stark
Affiliation:
Technische Universität. Darmstadt, United States
Jochen Mannhart
Affiliation:
Max Planck Institute for Solid State Research, United States
Peter A. van Aken
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2332 - 2333
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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