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Atomic-scale EDS Mapping for Chemical Imaging and Quantification of Interdiffusion in Self-assembled Vertically Aligned Nanocomposite Thin Films

Published online by Cambridge University Press:  23 September 2015

Ping Lu ,
Eric Romero ,
Jon Ihlefeld ,
Wei Pan ,
Wenrui Zhang ,
Haiyan Wang  and
Quanxi Jia
Ping Lu
Affiliation:
Sandia National Laboratories, P O Box 5800, Albuquerque, NM 87185, USA
Eric Romero
Affiliation:
Sandia National Laboratories, P O Box 5800, Albuquerque, NM 87185, USA
Jon Ihlefeld
Affiliation:
Sandia National Laboratories, P O Box 5800, Albuquerque, NM 87185, USA
Wei Pan
Affiliation:
Sandia National Laboratories, P O Box 5800, Albuquerque, NM 87185, USA
Wenrui Zhang
Affiliation:
Materials Science and Engineering Program, Texas A & M University, College Station, TX 77843-3128 USA.
Haiyan Wang
Affiliation:
Materials Science and Engineering Program, Texas A & M University, College Station, TX 77843-3128 USA.
Quanxi Jia
Affiliation:
Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2249 - 2250
Copyright
Copyright © Microscopy Society of America 2015 

References

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