Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-29T17:44:03.396Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic-scale Dual-EELS/EDX Spectroscopy Applied to Rare-earth Oxide Superlattices

Published online by Cambridge University Press:  23 September 2015

P.J. Phillips ,
P. Longo ,
E. Okunishi  and
R.F. Klie
P.J. Phillips
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago IL 60607
P. Longo
Affiliation:
Gatan, INC, Pleasanton, CA 94588
E. Okunishi
Affiliation:
EM Application Group, JEOL Ltd., 3-1-2 Musashino, Tokyo 198558, Japan
R.F. Klie
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago IL 60607

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 495 - 496
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Kumah, D.P., Disa, A.S., Ngai, J.H., Chen, H., Malashevich, A., Reiner, J.W., Ismail-Beigi, S., Walker, F.J. & Ahn, C.H., Adv. Mater. 26 (2014) 1935–1940.Google Scholar
[2] Chen, H., Kumah, D.P., Disa, A.S., Walker, F.J, Ahn, C.H. & Ismail-Beigi, S., Phys. Rev. Lett. 110 (2013) 186402.Google Scholar