No CrossRef data available.
Article contents
Atomic-scale Chemical Manipulation of Materials in the Scanning Transmission Electron Microscope under Controlled Atmospheres
Published online by Cambridge University Press: 05 August 2019
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927619007724/resource/name/firstPage-S1431927619007724a.jpg)
- Type
- In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[2]Leuthner, G T et al. , Ultramic. in press (2019), doi: 10.1016/j.ultramic.2019.02.002.Google Scholar
[8]The authors acknowledge funding from the University of Vienna uni:docs fellowship programme, the Austrian Science Fund (FWF) through projects I3181 and P31605 as well as the Wiener Wissenschafts-, Forschungs- und Technologiefonds (WWTF) through project MA14-009.Google Scholar