Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-23T01:02:58.733Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic-Resolution STEM Imaging of Materials Using a Segmented Annular All Field Detector

Published online by Cambridge University Press:  01 August 2010

N Shibata ,
SD Findlay ,
Y Kohno ,
H Sawada ,
Y Kondo  and
Y Ikuhara
N Shibata
Affiliation:
The University of Tokyo, Japan
SD Findlay
Affiliation:
The University of Tokyo, Japan
Y Kohno
Affiliation:
JEOL Ltd, Japan
H Sawada
Affiliation:
JEOL Ltd, Japan
Y Kondo
Affiliation:
JEOL Ltd, Japan
Y Ikuhara
Affiliation:
The University of Tokyo, Japan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 124 - 125
Copyright
Copyright © Microscopy Society of America 2010