Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-29T13:15:42.185Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic-resolution Imaging Using Cs-corrected Vortex Beams

Published online by Cambridge University Press:  27 August 2014

Peter Ercius ,
Tyler Harvey ,
Jordan Pierce ,
Jordan Chess ,
Martin Linck  and
Ben McMorran
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA
Tyler Harvey
Affiliation:
Department of Physics, 1274 University of Oregon, Eugene OR
Jordan Pierce
Affiliation:
Department of Physics, 1274 University of Oregon, Eugene OR
Jordan Chess
Affiliation:
Department of Physics, 1274 University of Oregon, Eugene OR
Martin Linck
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Ben McMorran
Affiliation:
Department of Physics, 1274 University of Oregon, Eugene OR

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 84 - 85
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Verbeeck, J, Tian, H and Schattschneider, P Nature, 467 (2010), p. 301 - 304.Google Scholar
[2] McMorran, B, et al, Science 331 (2011), p. 192 - 195.Google Scholar
[3] NCEM is supported by the U.S. Department of Energy under contract no. DE-AC02-05CH11231.Google Scholar