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Atomic-Plane Resolved Electron Magnetic Circular Dichroism by Achromatic Spatially-Resolved Electron Energy Loss Spectroscopy

Published online by Cambridge University Press:  05 August 2019

Xiaoyan Zhong
Xiaoyan Zhong*
Affiliation:
National Center for Electron Microscopy in Beijing, Key Laboratory of Advanced Materials (MOE), The State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing, P.R.China.

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 572 - 573
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Chao, WL et al. , Nature 435 (2005), p. 1210.Google Scholar
[2]Schattschneider, P et al. , Nature 441 (2006), p. 486.Google Scholar
[3]Wang, ZQ et al. , Nature Communications 4 (2013), 1395.Google Scholar
[4]Wang, ZC et al. , Nature Materials 17 (2018), p. 221.Google Scholar
[5]Chen, XF, Wang, ZC and Zhong, XY, Journal of Chinese Electron Microscopy Society, 37 (2018), p. 548.Google Scholar
[6]Ho, PL et al. , Ultramicroscopy 193 (2018), p. 137.Google Scholar
[7]Jin, L et al. , Advanced Materials Interfaces 3 (2016), #1600414.Google Scholar
[8]Lin, J et al. , Physical Review Materials, 1 (2017), 071404(R).Google Scholar
[9]The author acknowledges funding from National Key Research and Development Program (2016YFB0700402), National Natural Science Foundation of China (11834009, 51761135131, 51822105, 51671112, 51788104), National Basic Research Program of China (2015CB921700) and Fund of Key Laboratory of Advanced Materials of Ministry of Education (2018AML12). This work made use of the resources of the National Center for Electron Microscopy in Beijing. Mr. ZC Wang, Dr. AH Tavabi, Dr. L Jin, Dr. J Rusz, Dr. D Tyutyunnikov, Mr. HB Jiang, Prof. Y Moritomo, Prof. J Mayer, Prof. RE Dunin-Borkowski, Prof. R Yu and Prof. J Zhu are thanked for their valuable contributions to this work.Google Scholar