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Atomic Structure of Extended Defects in GaAs-based Heterostructures
Published online by Cambridge University Press: 05 August 2019
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- Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]This work was supported by the National Science Foundation and the Department of Energy under NSF CA No. EEC-1041895. The authors acknowledge the use of facilities within the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University.Google Scholar
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