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Atomic Scale Study of Point Defects in Graphene using STEM

Published online by Cambridge University Press:  09 April 2017

W Zhou ,
M Prange ,
M Oxley ,
S Pantelides ,
S Pennycook ,
J Nanda ,
C Narula  and
J-C Idrobo
W Zhou
Affiliation:
Vanderbilt University
M Prange
Affiliation:
Vanderbilt University
M Oxley
Affiliation:
Vanderbilt University
S Pantelides
Affiliation:
Vanderbilt University
S Pennycook
Affiliation:
Oak Ridge National Laboratory
J Nanda
Affiliation:
Oak Ridge National Laboratory
C Narula
Affiliation:
Oak Ridge National Laboratory
J-C Idrobo
Affiliation:
Vanderbilt University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1498 - 1499
Copyright
Copyright © Microscopy Society of America 2011