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Atomic Scale Characterization of Oxygen-Deficient Ceramic Membranes by EELS and Z-Contrast Imaging

Published online by Cambridge University Press:  02 July 2020

Robert F. Klie ,
Yasuo Ito ,
Nigel D. Browning ,
Susanne Stemmer  and
Terry J. Mazanec
Robert F. Klie
Affiliation:
Department of Physics, University of Illinois at Chicago, 845 W. Taylor Street #2236, Chicago, IL60607-7059.
Yasuo Ito
Affiliation:
Department of Physics, University of Illinois at Chicago, 845 W. Taylor Street #2236, Chicago, IL60607-7059.
Nigel D. Browning
Affiliation:
Department of Physics, University of Illinois at Chicago, 845 W. Taylor Street #2236, Chicago, IL60607-7059.
Susanne Stemmer
Affiliation:
Department of Mechanical Engineering and Material Science, Rice University, 6100 Main Street, Houston, TX77005-1892
Terry J. Mazanec
Affiliation:
BP Amoco Chemicals, 150 West Warrenville Road, P.O. Box 3011, Naperville, IL60566-7011
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Extract

The Perovskite structured ceramic (Lax,Sr1-x)(Fey,Cr1-y)O3-δ being developed for applications in oxygen transporting membranes. The permeability of this material is limited by the number of free ions, point-defects (oxygen vacancies) and electrons in the bulk. As any ordering of these unbound particles will restrict their mobility one key issue for controlling the membrane efficiency is the formation of ordered oxygen vacancies. In particular it is very likely, that at elevated temperatures ordered micro-domains progressively grow and asymptotically reach a stable equilibrium concentration. This is consistent with the observations of Kruidhof that below a specific order-disorder transition temperature equilibrium times of 30-40 h are required to attain steady-state conditions, irrespective of the thermal history of the sample.

We investigate the formation of ordered vacancies in (Lax,Sr1-x)(Fey,Cr1-y)O3-δ by atomic resolution Z-contrast imaging and electron energy-loss spectroscopy (EELS) using a 200 keV STEM/TEM JEOL2010L with a post column Gatan Image Filter (GIF).

Type
The Theory and Practice of Scanning Transmission Electron Microscopy
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 118 - 119
Copyright
Copyright © Microscopy Society of America

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References

[1]Kruidhof, H. et al., Solid State Ionics 63-65 (1993)CrossRefGoogle Scholar
[2]James, E. M. and Browning, N. D., Ultramicroscopy 78 (1999)CrossRefGoogle Scholar
[3]Rao, C. N. R. et al., Indian Journal of Chemistry 23A (1984)Google Scholar
[4]Wang, Z. L. and Kang, Z. C., Functional and smart materials, structural evolution and structure analysis, Plenum Press (1998)CrossRefGoogle Scholar
[5]Stemmer, S. et al., Solid State Ionics (2000), in pressGoogle Scholar
[6] This work is supported by the U.S. Dept. of Energy, through the University of Alaska (No. DE-FC26- 99FT40054). The JEOL 2010F microscope was purchased with support from the National Science Foundation (NSF-DMR-9601792), and is operated by the Research Resources Center at the University of Illinois at ChicagoGoogle Scholar