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Atomic Resolution Z-contrast Imaging and EELS: Application for Ge/SiO2 Interface

Published online by Cambridge University Press:  24 July 2003

S. Lopatin ,
G. Duscher  and
W. Windl
S. Lopatin
Affiliation:
Department of Materials Science and Engineering, NC State University, Raleigh, NC 27695
G. Duscher
Affiliation:
Department of Materials Science and Engineering, NC State University, Raleigh, NC 27695 Oak Ridge National Laboratory, Oak Ridge, TN 37831
W. Windl
Affiliation:
Dept. of Materials Science and Engineering, Ohio State University, Columbus, OH 43210

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 818 - 819
Copyright
Copyright © Microscopy Society of America 2003