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Atomic Resolution Study of Local Strains in Doped VO2 Nanowires

Published online by Cambridge University Press:  27 August 2014

Hasti Asayesh-Ardakani ,
Anmin Nie ,
Peter M. Marley ,
Sujay Singh ,
Patrick J. Philips ,
Farzad Mashayek ,
Ganapathy Sambandamurthy ,
Ke-bin Low ,
Robert F. Klie  and
Sarbajit Banerjee
...Show all authors
Hasti Asayesh-Ardakani
Affiliation:
Department of Mechanical Engineering, Michigan Technological University, Houghton, MI 49933-1295, USA Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059, USA
Anmin Nie
Affiliation:
Department of Mechanical Engineering, Michigan Technological University, Houghton, MI 49933-1295, USA Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059, USA
Peter M. Marley
Affiliation:
Department of Chemistry, University at Buffalo, State University of New York, Buffalo, New York 14260-3000, USA
Sujay Singh
Affiliation:
Department of Physics, University at Buffalo, State University of New York, Buffalo, New York 14260-3000, USA
Patrick J. Philips
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059, USA
Farzad Mashayek
Affiliation:
Department of Mechanical and Industrial Engineering, University of Illinois at Chicago, Chicago, IL60607-7059, USA
Ganapathy Sambandamurthy
Affiliation:
Department of Physics, University at Buffalo, State University of New York, Buffalo, New York 14260-3000, USA
Ke-bin Low
Affiliation:
Research Resource Center, University of Illinois at Chicago, IL60607-7059, USA
Robert F. Klie
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059, USA
Sarbajit Banerjee
Affiliation:
Department of Chemistry, University at Buffalo, State University of New York, Buffalo, New York 14260-3000, USA
Gregory M. Odegard
Affiliation:
Department of Mechanical Engineering, Michigan Technological University, Houghton, MI 49933-1295, USA
Reza Shahbazian-Yassar
Affiliation:
Department of Mechanical Engineering, Michigan Technological University, Houghton, MI 49933-1295, USA Department of Physics, University of Illinois at Chicago, Chicago, IL60607-7059, USA Department of Mechanical and Industrial Engineering, University of Illinois at Chicago, Chicago, IL60607-7059, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1074 - 1075
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Morin, FJ Phys Rev Lett 3 (1959), p. 34.Google Scholar
[2] Eyert, V Ann Phys (Berlin) 11 (2002), p. 650.Google Scholar
[3] Wu, T-L, Whittaker, L, Banerjee, S and Sambandamurthy, G Phys Rev B 83 (2011), p. 073101.Google Scholar