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Atomic Resolution STEM-EELS Study of Transition Electronic Localization State Induced by Strain

Published online by Cambridge University Press:  23 September 2015

Yuze Gao ,
Manuel A. Roldan ,
Jincang Zhang ,
Liang Qiao ,
Miaofang Chi ,
David Mandrus ,
Xuechu Shen ,
Matthew F. Chisholm ,
David J. Singh  and
Guixin Cao
Yuze Gao
Affiliation:
Department of Physics, Shanghai University, Shanghai 200444, PR China.
Manuel A. Roldan
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6056, USA Dept. Fisica Aplicada III & Instituto Pluridisciplinar, Universidad Complutense de Madrid, Ciudad Universitaria, 28040 Madrid, Spain
Jincang Zhang
Affiliation:
Department of Physics, Shanghai University, Shanghai 200444, PR China.
Liang Qiao
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Miaofang Chi
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6056, USA
David Mandrus
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6056, USA Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996
Xuechu Shen
Affiliation:
National Laboratory for Infrared physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People’s Republic of China
Matthew F. Chisholm
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6056, USA
David J. Singh
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6056, USA
Guixin Cao
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 617 - 618
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Schwartz, T., et al, Nature 446 (2007). p. 52–55.CrossRefGoogle Scholar
[2] Lee, P. & Ramakrishnan, T.V., Rev Mod Phys 57 (1985). p. 287–337.CrossRefGoogle Scholar
[3] The authors thank S. Dong at Eastsouth University and Z. Gai in ORNL for useful discussions. Work at ORNL was supported by the Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division (MAR, LQ, MC, DM, MFC, DJS, GC) and by the European Research Council Starting Investigator Award "STEMOX 239739" (MAR).Google Scholar