Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-20T13:31:44.486Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Resolution in MoS2 Few Layered using Cs-corrected STEM at 80 kV

Published online by Cambridge University Press:  23 November 2012

A. Ponce ,
R. Esparza ,
A. Garcia  and
M. Jose Yacaman
A. Ponce
Affiliation:
Physics and Astronomy, University of Texas at San Antonio, San Antonio, TX
R. Esparza
Affiliation:
Physics and Astronomy, University of Texas at San Antonio, San Antonio, TX
A. Garcia
Affiliation:
Physics and Astronomy, University of Texas at San Antonio, San Antonio, TX
M. Jose Yacaman
Affiliation:
Physics and Astronomy, University of Texas at San Antonio, San Antonio, TX
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1440 - 1441
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)