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Atomic Resolution Imaging of Dislocations in AlGaN and the Efficiency of UV LEDs

Published online by Cambridge University Press:  01 August 2018

Colin J. Humphreys
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK. School of Engineering and Materials Science, Queen Mary University of London, London, UK.
Fabien C-P. Massabuau
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.
Sneha L. Rhode
Affiliation:
Department of Materials, Imperial College London, London, UK.
Matthew K. Horton
Affiliation:
Materials Science and Engineering, University of California Berkeley, California, USA.
Thomas J. O’Hanlon
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.
Andras Kovacs
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Griinberg Institute, Forschungszentrum Julich GmbH, Julich, Germany.
Marcin S. Zielinski
Affiliation:
Attolight AG, EPFL Innovation Park, Lausanne, Switzerland.
Menno J. Kappers
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.
Rafal E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Griinberg Institute, Forschungszentrum Julich GmbH, Julich, Germany.
Rachel A. Oliver
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.

Abstract

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Abstract
Copyright
© Microscopy Society of America 2018 

References

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[13] The authors acknowledge funding from the European Research Council, Grant 279361 (MACONS), the EU Grant 312483 (ESTEEM2), an ERC Starting Grant 307636 (SCOPE), the Lindemann Trust Fellowship and the EPSRC Grant EP/M010589/1 (Beyond Blue: New Horizons in Nitrides).Google Scholar