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Atomic Imaging Across Strain Boundaries in Bilayer Graphene with ADF-STEM and DF-TEM

Published online by Cambridge University Press:  27 August 2014

Robert Hovden ,
Jonathan Alden ,
Adam W. Tsen ,
Pinshane Y. Huang ,
Lola Brown ,
Jiwoong Park ,
Paul L. McEuen  and
David A. Muller
Robert Hovden
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca NY
Jonathan Alden
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca NY
Adam W. Tsen
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca NY
Pinshane Y. Huang
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca NY
Lola Brown
Affiliation:
Department of Chemistry and Chemical Biology, Cornell University, Ithaca NY
Jiwoong Park
Affiliation:
Department of Chemistry and Chemical Biology, Cornell University, Ithaca NY Kavli Institute at Cornell University, Ithaca NY
Paul L. McEuen
Affiliation:
Department of Physics, Cornell University, Ithaca NY Kavli Institute at Cornell University, Ithaca NY
David A. Muller
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca NY Kavli Institute at Cornell University, Ithaca NY

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1058 - 1059
Copyright
Copyright © Microscopy Society of America 2014 

References

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[2] Brown, , et al., Nano Lett. 12, 1609 (2012).Google Scholar
[3] Alden, , et al., Proc. Natl. Acad. Sci. U.S.A. 110, 11256 (2013).Google Scholar
[4] Vaezi, , et al., Phys. Rev. X, 3, 021018 (2013).Google Scholar
[5] Lin, , et al., Nano Lett., 13, 3262 (2013).Google Scholar
[6] Funded by CCMR NSF MRSEC DMR-1120296, AFOSR FA9550-09-1-0691 and FA9550-10-1-0410.Google Scholar