Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-26T16:34:08.459Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Force Scanning Electrochemical Microscopy (AFM-SECM) for Electrochemical Imaging at the Nanoscale

Published online by Cambridge University Press:  05 August 2007

J-S Moon ,
J Wiedemair ,
J-F Masson ,
B Mizaikoff  and
C Kranz
J-S Moon
Affiliation:
Georgia Institute of Technology
J Wiedemair
Affiliation:
Georgia Institute of Technology
J-F Masson
Affiliation:
Georgia Institute of Technology
B Mizaikoff
Affiliation:
Georgia Institute of Technology
C Kranz
Affiliation:
Georgia Institute of Technology
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 58 - 59
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)