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Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip

Published online by Cambridge University Press:  16 July 2019

Zhe Chen ,
Jiawei Luo ,
Ivo Doudevski ,
Sema Erten  and
Seong H. Kim
Zhe Chen
Affiliation:
Department of Chemical Engineering, Pennsylvania State University, University Park, PA 16802, USA Materials Research Institute, Pennsylvania State University, University Park, PA 16802, USA
Jiawei Luo
Affiliation:
Department of Chemical Engineering, Pennsylvania State University, University Park, PA 16802, USA Materials Research Institute, Pennsylvania State University, University Park, PA 16802, USA
Ivo Doudevski
Affiliation:
Materials Research Institute, Pennsylvania State University, University Park, PA 16802, USA
Sema Erten
Affiliation:
Materials Research Institute, Pennsylvania State University, University Park, PA 16802, USA
Seong H. Kim*
Affiliation:
Department of Chemical Engineering, Pennsylvania State University, University Park, PA 16802, USA Materials Research Institute, Pennsylvania State University, University Park, PA 16802, USA
*
*Author for correspondence: Seong H. Kim, E-mail: [email protected]
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Abstract

Atomic force microscopy (AFM) is typically used for analysis of relatively flat surfaces with topographic features smaller than the height of the AFM tip. On flat surfaces, it is relatively easy to find the object of interest and deconvolute imaging artifacts resulting from the finite size of the AFM tip. In contrast, AFM imaging of three-dimensional objects much larger than the AFM tip height is rarely attempted although it could provide topographic information that is not readily available from two-dimensional imaging, such as scanning electron microscopy. In this paper, we report AFM measurements of a vertically-mounted razor blade, which is taller and sharper than the AFM tip. In this case, the AFM height data, except for the data collected around the cutting edge of the blade, reflect the shape of the AFM tip. The height data around the apex area are effectively the convolution of the AFM tip and the blade cutting edge. Based on computer simulations mimicking an AFM tip scanning across a round sample, a simple algorithm is proposed to deconvolute the AFM height data of an object taller and sharper than the AFM tip and estimate its effective curvature.

Keywords

atomic force microscopydeconvolutionrazor bladesharpnesstopography
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 25 , Issue 5 , October 2019 , pp. 1106 - 1111
Copyright
Copyright © Microscopy Society of America 2019 

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References

Allen, MJ, Hud, NV, Balooch, M, Tench, RJ, Siekhaus, WJ & Balhorn, R (1992). Tip-radius-induced artifacts in AFM images of protamine-complexed DNA fibers. Ultramicroscopy 42-44, 1095–1100.Google Scholar
Atamny, F & Baiker, A (1995). Direct imaging of the tip shape by AFM. Surf Sci 323(3), L314–L318.Google Scholar
Binnig, G, Quate, CF & Gerber, C (1986). Atomic force microscope. Phys Rev Lett 56(9), 930–933.Google Scholar
Dongmo, LS, Villarrubia, JS, Jones, SN, Renegar, TB, Postek, MT & Song, JF (2000). Experimental test of blind tip reconstruction for scanning probe microscopy. Ultramicroscopy 85(3), 141–153.Google Scholar
Flater, EE, Zacharakis-Jutz, GE, Dumba, BG, White, IA & Clifford, CA (2014). Towards easy and reliable AFM tip shape determination using blind tip reconstruction. Ultramicroscopy 146, 130–143.Google Scholar
Gołek, F, Mazur, P, Ryszka, Z & Zuber, S (2014). AFM image artifacts. Appl Surf Sci 304, 11–19.Google Scholar
Hübner, U, Morgenroth, W, Meyer, HG, Sulzbach, T, Brendel, B & Mirandé, W (2003). Downwards to metrology in nanoscale: Determination of the AFM tip shape with well-known sharp-edged calibration structures. Appl Phys A 76(6), 913–917.Google Scholar
Josep, C-F, Eugenio, C, Alicia, F-A & Elena, P-C (2014). Correction of the tip convolution effects in the imaging of nanostructures studied through scanning force microscopy. Nanotechnology 25(39), 395703.Google Scholar
Keller, D (1991). Reconstruction of STM and AFM images distorted by finite-size tips. Surf Sci 253(1), 353–364.Google Scholar
Kondratov, AV, Rogov, OY & Gainutdinov, RV (2017). AFM reconstruction of complex-shaped chiral plasmonic nanostructures. Ultramicroscopy 181, 81–85.Google Scholar
Lui, CH, Liu, L, Mak, KF, Flynn, GW & Heinz, TF (2009). Ultraflat graphene. Nature 462, 339–341.Google Scholar
Montelius, L & Tegenfeldt, JO (1993). Direct observation of the tip shape in scanning probe microscopy. Appl Phys Lett 62 (21), 2628–2630.Google Scholar
Reiss, G, Schneider, F, Vancea, J & Hoffmann, H (1990). Scanning tunneling microscopy on rough surfaces: Deconvolution of constant current images. Appl Phys Lett 57(9), 867–869.Google Scholar
Ricci, D & Braga, PC (2004). Recognizing and avoiding artifacts in AFM imaging. In Atomic Force Microscopy: Biomedical Methods and Applications, Braga, PC & Ricci, D (Eds.), pp. 25–37. Totowa, New Jersey: Humana Press.Google Scholar
Scienceofsharp (2015). The pasted strop – Part 3. Available at https://scienceofsharp.wordpress.com/2015/03/31/the-pasted-strop-part-3/ (retrieved May 05, 2019).Google Scholar
Severin, N, Dorn, M, Kalachev, A & Rabe, JP (2011). Replication of single macromolecules with graphene. Nano Lett 11(6), 2436–2439.Google Scholar
Shen, J, Zhang, D, Zhang, F-H & Gan, Y (2017). AFM tip-sample convolution effects for cylinder protrusions. Appl Surf Sci 422, 482–491.Google Scholar
Tranchida, D, Piccarolo, S & Deblieck, RAC (2006). Some experimental issues of AFM tip blind estimation: The effect of noise and resolution. Meas Sci Technol 17(10), 2630–2636.Google Scholar
Villarrubia, JS (1994). Morphological estimation of tip geometry for scanned probe microscopy. Surf Sci 321(3), 287–300.Google Scholar
Villarrubia, JS (1997). Algorithms for scanned probe microscope image simulation, surface reconstruction, and tip estimation. J Res Natl Inst Stand Technol 102(4), 425–454.Google Scholar
Winzer, AT, Kraft, C, Bhushan, S, Stepanenko, V & Tessmer, I (2012). Correcting for AFM tip induced topography convolutions in protein–DNA samples. Ultramicroscopy 121, 8–15.Google Scholar