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Atomic electrostatic maps of sulfur vacancies in MoS2 by differential phase contrast

Published online by Cambridge University Press:  30 July 2021

Sebastian Calderon ,
Rafael Ferreira ,
Deepyanti Taneja ,
Jayanth Raghavendrarao ,
Langyan Zhou ,
Deji Akinwande  and
Paulo Ferreira
Sebastian Calderon
Affiliation:
International Iberian Nanotechnology Laboratory, Braga, Portugal
Rafael Ferreira
Affiliation:
International Iberian Nanotechnology Laboratory, Braga, Portugal
Deepyanti Taneja
Affiliation:
The University of Texas at Austin, United States
Jayanth Raghavendrarao
Affiliation:
The University of Texas at Austin, United States
Langyan Zhou
Affiliation:
The University of Texas at Austin, United States
Deji Akinwande
Affiliation:
The University of Texas at Austin, United States
Paulo Ferreira
Affiliation:
International Iberian Nanotechnology Laboratory, United States

Abstract

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Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1744 - 1745
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Müller-Caspary, K., Krause, F.F., Winkler, F., Béché, A., Verbeeck, J., Van Aert, S., Rosenauer, A., Ultramicroscopy. 203 (2019) 95–104. doi:10.1016/j.ultramic.2018.12.018.CrossRefGoogle Scholar
Lugg, N.R., Seki, T., Ishikawa, R., Findlay, S.D., Kohno, Y., Kanitani, Y., Tanaka, S., Tomiya, S., Ikuhara, Y., (2018). doi:10.1021/acsnano.8b03712.CrossRefGoogle Scholar
Ishikawa, R., Findlay, S.D., Seki, T., Sánchez-santolino, G., Ikuhara, Y., Shibata, N., Kohno, Y., Nat. Commun. (n.d.) 8–13. doi:10.1038/s41467-018-06387-8.CrossRefGoogle Scholar
Lazić, Ivan, Bosch, Eric G.T., Lazar, Sorin, Ultramicroscopy, Volume 160, 2016, Pages 265-280,CrossRefGoogle Scholar
Shibata, N.; Seki, T.; Sánchez-Santolino, G.; Findlay, S. D.; Kohno, Y.; Matsumoto, T.; Ishikawa, R.; Ikuhara, Y. Nat. Commun. 2017, 8, 15631.Google Scholar
Sánchez-Santolino, Gabriel, Lugg, Nathan R., Seki, Takehito, Ishikawa, Ryo, Findlay, Scott D., Kohno, Yuji, Kanitani, Yuya, Tanaka, Shinji, Tomiya, Shigetaka, Ikuhara, Yuichi, and Naoya Shibata, ACS Nano 2018 12 (9), 8875-8881Google Scholar