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Atomic Electron Tomography: Adding a New Dimension to See Single Atoms in Materials

Published online by Cambridge University Press:  01 August 2018

Jianwei Miao ,
Yongsoo Yang ,
Jihan Zhou ,
Xuezeng Tian ,
Yao Yang ,
Dennis S. Kim ,
Alan Pryor Jr. ,
Peter Ercius ,
Colin Ophus  and
M. C. Scott
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Jianwei Miao
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, and University of California, Los Angeles, CA
Yongsoo Yang
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, and University of California, Los Angeles, CA
Jihan Zhou
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, and University of California, Los Angeles, CA
Xuezeng Tian
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, and University of California, Los Angeles, CA
Yao Yang
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, and University of California, Los Angeles, CA
Dennis S. Kim
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, and University of California, Los Angeles, CA
Alan Pryor Jr.
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, and University of California, Los Angeles, CA
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA
M. C. Scott
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA Department of Materials Science and Engineering, University of California, Berkeley, CA
Chien-Chun Chen
Affiliation:
Department of Physics, National Sun Yat-sen University, Kaohsiung, Taiwan
Wolfgang Theis
Affiliation:
Nanoscale Physics Research Laboratory, School of Physics and Astronomy, University of Birmingham, Birmingham, UK
Markus Eisenbach
Affiliation:
National Center for Computational Sciences, Oak Ridge National Laboratory, Oak Ridge, TN
Paul R. C. Kent
Affiliation:
Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN
Renat F. Sabirianov
Affiliation:
Department of Physics, University of Nebraska at Omaha, Omaha, NE
Hao Zeng
Affiliation:
Department of Physics, University at Buffalo, the State University of New York, Buffalo, NY

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 558 - 559
Copyright
© Microscopy Society of America 2018 

References

[1] Miao, J., Ercius, P. Billinge, S. Science 353 2016 aaf2157.Google Scholar
[2] Miao, J., Foster, F. Levi, O. Phys. Rev. B 72 2005) p. 052103.Google Scholar
[3] Pryor, A. Jr., et al, Sci. Rep. 7 2017) p. 10409.Google Scholar
[4] Scott, M. C., et al, Nature 483 2012) p. 444.Google Scholar
[5] Chen, C.-C., et al, Nature 496 2013) p. 74.Google Scholar
[6] Xu, R., et al, Nature Mater. 14 2015) p. 1099.Google Scholar
[7] Yang, Y., et al, Nature 542 2017) p. 75.Google Scholar
[8] This work was supported by STROBE: A National Science Foundation Science & Technology Center under Grant No. DMR 1548924, and the Office of Basic Energy Sciences of the U.S. Department of Energy (Grant No. DE-SC0010378). ADF-STEM imaging was performed on TEAM I at the Molecular Foundry, which is supported by the Office of Science, Office of Basic Energy Sciences of the U.S. Department of Energy under Contract No. DE-AC02—05CH11231..Google Scholar