Atom Probe Tomography Characterization of a White Etching Area in a Bearing Steel

J. Kang; C. Williams; B. Hosseinkhani; P.E. Rivera Diaz del Castillo; P.A. Bagot; M.P. Moody

doi:10.1017/S1431927613007071

Atom Probe Tomography Characterization of a White Etching Area in a Bearing Steel

Published online by Cambridge University Press: 09 October 2013

J. Kang ,

C. Williams ,

B. Hosseinkhani ,

P.E. Rivera Diaz del Castillo ,

P.A. Bagot and

M.P. Moody

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J. Kang: Affiliation:
C. Williams: Affiliation:
B. Hosseinkhani: Affiliation:
P.E. Rivera Diaz del Castillo: Affiliation:
P.A. Bagot: Affiliation:
M.P. Moody: Affiliation:

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Abstract

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1016 - 1017

DOI: https://doi.org/10.1017/S1431927613007071 [Opens in a new window]

Article contents

Atom Probe Tomography Characterization of a White Etching Area in a Bearing Steel

Abstract

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