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Atom Probe Studies of the Nanochemistry of Steels

Published online by Cambridge University Press:  02 July 2020

G.D.W. Smith ,
A. Cerezo ,
T.J. Godfrey ,
J. Wilde  and
F.M. Venker
G.D.W. Smith
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, U.K.
A. Cerezo
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, U.K.
T.J. Godfrey
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, U.K.
J. Wilde
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, U.K.
F.M. Venker
Affiliation:
Department of Applied Physics, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands.
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Extract

Steels represent by far the most widely used class of engineering alloys, and comprise almost 95% of total world metal production. Yet despite their familiarity and ubiquitous distribution, many fundamental questions remain unanswered regarding the nature of the solid state chemical reactions occurring during the heat treatment of steels, the mechanisms by which alloy additions affect the kinetics of these processes, and the role of trace impurities on properties.

The difficulties involved in studying such processes experimentally arise from two main sources. Firstly, the effects involved are often on an extremely fine scale. Secondly, one of the key elements involved is carbon, which is extremely difficult to study by conventional microanalytical techniques.

Remarkable progress has been achieved in these areas through the application of the atom probe method. Much of this work has been reviewed in a recent monograph by Miller et al.

Type
Imaging and Analysis at the Atomic Level: 30 Years of Atom Probe Field Ion Microscopy
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 104 - 105
Copyright
Copyright © Microscopy Society of America

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References

1."Atom Probe Field Ion Microscopy", Miller, M.K, Cerezo, A., Hetherington, M.G. and Smith, G.D.W., Oxford University Press, Oxford U.K. (1996), Chapter 6.Google Scholar
2.Cerezo, A., Godfrey, T.J. and Smith, G.D.W., Rev. Sci. Instrum. 59 (1988) 862.CrossRefGoogle Scholar
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6.Cerezo, A. et al., Rev. Sci. Instrum. 69 (1998) 49.CrossRefGoogle Scholar
7. This research was supported by the Engineering and Physical Sciences Research Council (U.K.), the R.W.Paul Instrument Fund, and Kindbrisk Ltd, Eynsham, Oxfordshire, U.K. We thank Les Editions de Physique for permission to reproduce illustrations.Google Scholar