Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-24T01:09:28.187Z Has data issue: false hasContentIssue false
  • English
  • Français

Approaches to Monitoring Structural Modification Using In Situ Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Thomas W. Hansen ,
William Bang Lomholdt ,
Matthew Helmi Leth Larsen ,
Cuauhtémoc Núñez Valencia ,
Jens Kling ,
Daniel Kelly ,
Pei Liu  and
Jakob Schiøtz
Thomas W. Hansen*
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
William Bang Lomholdt
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Matthew Helmi Leth Larsen
Affiliation:
Department of Physics, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Cuauhtémoc Núñez Valencia
Affiliation:
Department of Physics, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Jens Kling
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Daniel Kelly
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Pei Liu
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
Jakob Schiøtz
Affiliation:
Department of Physics, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Beyond Visualization with In Situ and Operando TEM
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 144 - 145
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Liu, P., Madsen, J., Schiøtz, J. et al. , J. Phys.: Mater. 3 (2020), 024009.Google Scholar
Liu, P., Wu, T. T., Madsen, J. et al. , Nanoscale 11 (2019), 11885-11891.10.1039/C9NR02731ACrossRefGoogle Scholar
Madsen, J., Liu, P., Kling, J. et al. , Advanced Theory and Simulations 1 (2018), 12.10.1002/adts.201800037CrossRefGoogle Scholar
Madsen, J., Liu, P., Wagner, J. B. et al. , Adv. Struct. Chem. Imag. 3 (2017), 14.10.1186/s40679-017-0047-0CrossRefGoogle Scholar