Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-20T05:45:00.203Z Has data issue: false hasContentIssue false
  • English
  • Français

Applying the Dynamic Transmission Electron Microscope to Study Fast Processes in Materials

Published online by Cambridge University Press:  31 July 2006

GH Campbell ,
TB LaGrange ,
WE King ,
ND Browning ,
MR Armstrong ,
JS Kim ,
BW Reed ,
AM Frank ,
BC Stuart  and
WJ DeHope
...Show all authors
GH Campbell
Affiliation:
University of California
TB LaGrange
Affiliation:
University of California
WE King
Affiliation:
University of California
ND Browning
Affiliation:
University of California
MR Armstrong
Affiliation:
University of California
JS Kim
Affiliation:
University of California
BW Reed
Affiliation:
University of California
AM Frank
Affiliation:
University of California
BC Stuart
Affiliation:
University of California
WJ DeHope
Affiliation:
University of California
BJ Pyke
Affiliation:
University of California
RM Shuttlesworth
Affiliation:
University of California
FV Hartemann
Affiliation:
University of California
DJ Gibson
Affiliation:
University of California

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1428 - 1429
Copyright
© 2006 Microscopy Society of America