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Applying Pattern Recognition to the Analysis of X-ray Computed Tomography Data of Polymer Foams

Published online by Cambridge University Press:  25 July 2016

Nikolaus L. Cordes ,
Zachary D. Smith ,
Kevin Henderson ,
James C. E. Mertens ,
Jason J. Williams ,
Tyler Stannard ,
Xianghui Xiao ,
Nikhilesh Chawla  and
Brian M. Patterson
Nikolaus L. Cordes
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos NM, USA
Zachary D. Smith
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos NM, USA
Kevin Henderson
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos NM, USA
James C. E. Mertens
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos NM, USA
Jason J. Williams
Affiliation:
Department of Materials Science and Engineering, School for Engineering of Matter, Transport, and Energy, Arizona State University, Tempe AZ, USA
Tyler Stannard
Affiliation:
Department of Materials Science and Engineering, School for Engineering of Matter, Transport, and Energy, Arizona State University, Tempe AZ, USA
Xianghui Xiao
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne IL, USA
Nikhilesh Chawla
Affiliation:
Department of Materials Science and Engineering, School for Engineering of Matter, Transport, and Energy, Arizona State University, Tempe AZ, USA
Brian M. Patterson
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos NM, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 104 - 105
Copyright
© Microscopy Society of America 2016