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Applications Using an Annular Four-Channel Silicon Drift Detector

Published online by Cambridge University Press:  01 August 2010

R Terborg ,
A Käppel  and
T Salge
R Terborg
Affiliation:
Bruker AXS Microanalysis
A Käppel
Affiliation:
Bruker AXS Microanalysis
T Salge
Affiliation:
Bruker AXS Microanalysis

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1302 - 1303
Copyright
Copyright © Microscopy Society of America 2010