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Applications of Low and Ultra-low Energy Scanning Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Ilona Müllerová ,
Luděk Frank ,
Šárka Mikmeková  and
Eliška Materna Mikmeková
Ilona Müllerová*
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Luděk Frank
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Šárka Mikmeková
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Eliška Materna Mikmeková
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
*
*Corresponding author: [email protected]

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 472 - 473
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Müllerová, I and Frank, L, Advances in Imaging and Electron Physics 128 (2003), p. 309.Google Scholar
[2]Drouin, D et al. , Scanning 29 (2007), p. 92.Google Scholar
[3]Frank, L, Mikmekova, E and Lejeune, M, Applied Surface Science 407 (2017), p. 105.Google Scholar
[4]The authors acknowledge funding from the Technology Agency of the Czech Republic (Competence center Electron microscopy, no: TE01020118).Google Scholar