Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2024-12-24T00:50:10.879Z Has data issue: false hasContentIssue false

Applications of Environmental SEM as In Situ Surface Science Tool with Atomic Layer Sensitivity

Published online by Cambridge University Press:  22 July 2022

Marc Willinger*
Affiliation:
Scientific Center of Optical and Electron Microscopy (ScopeM), ETH Zürich, Zürich, Switzerland
*
*Corresponding author: [email protected]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Beyond Visualization with In Situ and Operando TEM
Copyright
Copyright © Microscopy Society of America 2022

References

Wang, ZJ et al. , Nat Commun 7 (2016), p. 13256. https://doi.org/10.1038/ncomms13256CrossRefGoogle Scholar
Wang, ZJ et al. , Adv. Mater. Interfaces 5 (2018), p. 1800255. https://doi.org/10.1002/admi.201800255CrossRefGoogle Scholar
Barroo, C et al. , Nat Catal 3 (2020), p. 30. https://doi.org/10.1038/s41929-019-0395-3CrossRefGoogle Scholar
Cao, J et al. , Nat Commun 11 (2020), p. 3554. https://doi.org/10.1038/s41467-020-17346-7CrossRefGoogle Scholar
Huang, X et al. , Adv Mater. (2021), p, 2101772. https://doi.org/10.1002/adma.202101772CrossRefGoogle Scholar