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Applications of Environmental SEM as In Situ Surface Science Tool with Atomic Layer Sensitivity

Published online by Cambridge University Press:  22 July 2022

Marc Willinger
Marc Willinger*
Affiliation:
Scientific Center of Optical and Electron Microscopy (ScopeM), ETH Zürich, Zürich, Switzerland
*
*Corresponding author: [email protected]

Abstract

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Type
Beyond Visualization with In Situ and Operando TEM
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 164 - 165
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Copyright
Copyright © Microscopy Society of America 2022

References

Wang, ZJ et al. , Nat Commun 7 (2016), p. 13256. https://doi.org/10.1038/ncomms13256CrossRefGoogle Scholar
Wang, ZJ et al. , Adv. Mater. Interfaces 5 (2018), p. 1800255. https://doi.org/10.1002/admi.201800255CrossRefGoogle Scholar
Barroo, C et al. , Nat Catal 3 (2020), p. 30. https://doi.org/10.1038/s41929-019-0395-3CrossRefGoogle Scholar
Cao, J et al. , Nat Commun 11 (2020), p. 3554. https://doi.org/10.1038/s41467-020-17346-7CrossRefGoogle Scholar
Huang, X et al. , Adv Mater. (2021), p, 2101772. https://doi.org/10.1002/adma.202101772CrossRefGoogle Scholar