Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-05T02:30:22.717Z Has data issue: false hasContentIssue false
  • English
  • Français

Applications of EBSD to the Study of Localized Deformation

Published online by Cambridge University Press:  01 August 2005

R H Geiss ,
D T Read ,
A Roshko ,
K A Bertness  and
R R Keller
R H Geiss
Affiliation:
National Institute of Standards and Technology, Boulder, Colorado
D T Read
Affiliation:
National Institute of Standards and Technology, Boulder, Colorado
A Roshko
Affiliation:
National Institute of Standards and Technology, Boulder, Colorado
K A Bertness
Affiliation:
National Institute of Standards and Technology, Boulder, Colorado
R R Keller
Affiliation:
National Institute of Standards and Technology, Boulder, Colorado

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 516 - 517
Copyright
© 2005 Microscopy Society of America