Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-26T16:15:54.128Z Has data issue: false hasContentIssue false
  • English
  • Français

Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science

Published online by Cambridge University Press:  27 August 2014

Angus Kirkland ,
Judy Kim ,
Jamie Warner ,
Konstantin Borisenko ,
Sarah Haigh ,
Neil Young ,
Peng Wang  and
Peter Nellist
Angus Kirkland
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK
Judy Kim
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK
Jamie Warner
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK
Konstantin Borisenko
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK
Sarah Haigh
Affiliation:
School of Materials, The University of Manchester, Manchester M13 9PL, UK
Neil Young
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK
Peng Wang
Affiliation:
National Laboratory of Solid State Microstructures and College of Engineering and Applied sciences, Nanjing University, Nanjing 210093, People’sRepublic of China
Peter Nellist
Affiliation:
University of Oxford, Department of Materials, Parks Road, Oxford OX13PH, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 930 - 931
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Haider, M, et al., Nature 392 (1998) p.768.Google Scholar
[2] Krivanek, O.L, Dellby, N, Lupini, A.R Ultramicroscopy 78 (1999) p.1.Google Scholar
[3] Sawada, H, et al, J. Electron Microsc (Tokyo) 54 (2005) p.119.Google Scholar
[4] Mukai, M, et al, Ultramicroscopy, in press (2014).Google Scholar
[5] Warner, J. H, et al., Science 337 (2012) p.209.Google Scholar
[6] Cosgriff, E.C, et al., Advances in Imaging and Electron Physics, Ed. P W Hawkes 162 (2010) p.45.Google Scholar
[7] Haigh, S, Sawada, H, Kirkland, A. I Phil. Trans. Proc. Roy. Soc. A367 (2009) p.3755.Google Scholar
[8] Financial support from EPSRC (EP/F048009/1) and (EP/K032518/1) is gratefully acknowledged.Google Scholar