Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-22T19:29:40.121Z Has data issue: false hasContentIssue false
  • English
  • Français

Applications of a Triple Beam Microscope in Materials Science

Published online by Cambridge University Press:  22 July 2022

Stéphanie Bessette ,
Nicolas Brodusch ,
Sima A. Alidokht ,
Bruno Noronha Castilho ,
Richard R. Chromik  and
Raynald Gauvin
Stéphanie Bessette
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada
Nicolas Brodusch
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada
Sima A. Alidokht
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada
Bruno Noronha Castilho
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada
Richard R. Chromik
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada
Raynald Gauvin
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 22 - 23
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Suzuki, H, Hitachi Scientific Instrument News, 11 (2018) 110302.Google Scholar
Giannuzzi, L et al. , MRS Online Proceedings Library, 480 (1997), 19–27. doi:10.1557/PROC-480-19CrossRefGoogle Scholar
FIB results were collected on Hitachi Ethos NX5000 FIB-SEM located at the Facility for Electron Microscopy Research at McGill University.Google Scholar