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The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement

Published online by Cambridge University Press:  09 October 2013

S. Yazdi ,
T. Kasama ,
M. Beleggia ,
R. Ciechonski ,
O. Kryliouk  and
J.B. Wagner
S. Yazdi
Affiliation:
T. Kasama
Affiliation:
M. Beleggia
Affiliation:
R. Ciechonski
Affiliation:
O. Kryliouk
Affiliation:
J.B. Wagner
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1502 - 1503
Copyright
Copyright © Microscopy Society of America 2013