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Application of Electron-Beam-Excited Localized Surface Plasmon Resonance to Unveil Catalytically Active Sites on Au Nanoparticles

Published online by Cambridge University Press:  05 August 2019

Wei-Chang D. Yang ,
Canhui Wang ,
Lisa A. Fredin ,
Pin Ann Lin ,
Lisa Shimomoto ,
Henri J. Lezec  and
Renu Sharma
Wei-Chang D. Yang
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland, USA. Maryland NanoCenter, University of Maryland, College Park, Maryland, USA.
Canhui Wang
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland, USA. Maryland NanoCenter, University of Maryland, College Park, Maryland, USA.
Lisa A. Fredin
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland, USA.
Pin Ann Lin
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland, USA. Maryland NanoCenter, University of Maryland, College Park, Maryland, USA.
Lisa Shimomoto
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland, USA.
Henri J. Lezec
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland, USA.
Renu Sharma*
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1450 - 1451
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Mukherjee, S et al. , Nano Lett 13 (2013), p. 240.Google Scholar
[2]Christopher, P, Xin, H and Linic, S, Nat Chem 3 (2011), p. 467.Google Scholar
[3]Aslam, U, Chavez, S and Linic, S, Nat Nanotechnol 12 (2017), p. 1000.Google Scholar
[4]Hohenester, U, Computer Physics Communications 185 (2014), p. 1177.Google Scholar