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Application of Electron Probe Microanalysis to the Study of Geological and Planetary Materials

Published online by Cambridge University Press:  02 February 2002

James J. McGee  and
Klaus Keil
James J. McGee*
Affiliation:
Department of Geological Sciences, University of South Carolina, Columbia, SC 29208
Klaus Keil
Affiliation:
Hawaii Institute of Geophysics and Planetology, School of Ocean and Earth Science and Technology, University of Hawaii at Manoa, Honolulu, HI 96822
*
*Corresponding author, at Lockheed Martin Inc., Bin 107, P.O. Box 1072, Schenectady, NY 12301-1072.
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Abstract

The impact of electron probe microanalysis on the study of geological and planetary materials has been tremendous. Electron microprobes evolved into routine analytical instruments in geological research laboratories as instrument capabilities improved and applications to geologic/planetary materials expanded. The contributions of electron probe microanalysis to the characterization of minerals, both terrestrial and extraterrestrial, and to other significant geological research, such as light element analysis, trace element analysis, and element mapping, is described.

Keywords

electron microprobegeologymineralogylunar samplesmicroanalysismeteoriteslight element analysislayered synthetic microstructures
Type
Research Article
Information
Microscopy and Microanalysis , Volume 7 , Issue 2 , March 2001 , pp. 200 - 210
Copyright
Copyright © Microscopy Society of America 2001

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