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Application of Dual Beam FIB to the Metrology of Nanostructured Photovoltaic Devices

Published online by Cambridge University Press:  26 July 2009

G McMahon ,
J Rybczynski ,
Y Wang ,
Y Gao ,
N Argenti ,
K Kempa ,
ZF Ren  and
MJ Naughton
G McMahon
Affiliation:
Boston College
J Rybczynski
Affiliation:
Solasta Inc
Y Wang
Affiliation:
Solasta Inc
Y Gao
Affiliation:
Boston College
N Argenti
Affiliation:
Solasta Inc
K Kempa
Affiliation:
Boston College,Solasta Inc
ZF Ren
Affiliation:
Boston College,Solasta Inc
MJ Naughton
Affiliation:
Boston College,Solasta Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1392 - 1393
Copyright
Copyright © Microscopy Society of America 2009