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The Application of Cryogenic Focused Ion Beam Scanning Electron Microscopy to Hydrogel Characterization.

Published online by Cambridge University Press:  25 July 2016

Christopher Parmenter
Affiliation:
Nottingham Nanoscale and Microscale Research Centre, University of Nottingham, Nottingham, UK
Abdulraman Baki
Affiliation:
Wolfson Centre for Stem Cells, Tissue Engineering and Modelling (STEM), School of Pharmacy, University of Nottingham, Nottingham, UK
Kevin M Shakesheff
Affiliation:
Wolfson Centre for Stem Cells, Tissue Engineering and Modelling (STEM), School of Pharmacy, University of Nottingham, Nottingham, UK

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Al-Abboodi, A, et al, Biotech and Bioengineering 110 (2013). p 328.Google Scholar
[2] Marko, M, et al., J Microsc 222 (2006). p 42.Google Scholar