Application of Aberration-Corrected Transmission Electron Microscopy to Materials Science

K. Urban; M. Lentzen

doi:10.1017/S1431927602101474

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Crossref Citations

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Belich, T. J. Thompson, S. Perrey, C.R. Kortshagen, U. Carter, C.B. and Kakalios, J. 2003. Hydrogenated Amorphous Silicon Thin Films with Nanocrystalline Silicon Inclusions. MRS Proceedings, Vol. 762, Issue. ,

Hawkes, P.W. 2004. Some advances in electron optics since CPO-5. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 519, Issue. 1-2, p. 1.

Perrey, Christopher R. Thompson, Siri Lentzen, Markus Kortshagen, Uwe and Carter, C. Barry 2004. Observation of Si nanocrystals in a/nc-Si:H films by spherical-aberration corrected transmission electron microscopy. Journal of Non-Crystalline Solids, Vol. 343, Issue. 1-3, p. 78.

Thompson, S. Perrey, C. R. Carter, C. B. Belich, T. J. Kakalios, J. and Kortshagen, Uwe 2005. Experimental investigations into the formation of nanoparticles in a∕nc-Si:H thin films. Journal of Applied Physics, Vol. 97, Issue. 3,

Perrey, C. R. and Carter, C. B. 2006. Insights into nanoparticle formation mechanisms. Journal of Materials Science, Vol. 41, Issue. 9, p. 2711.

2022. Principles of Electron Optics, Volume 3. p. 1869.

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Application of Aberration-Corrected Transmission Electron Microscopy to Materials Science

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