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Annular Dark-Field Transmission Electron Microscopy for Low Contrast Materials

Published online by Cambridge University Press:  04 April 2013

F. Leroux ,
E. Bladt ,
J.-P. Timmermans ,
G. Van Tendeloo  and
S. Bals
F. Leroux
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171 B-2020 Antwerp, Belgium
E. Bladt
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171 B-2020 Antwerp, Belgium
J.-P. Timmermans
Affiliation:
Laboratory of Cell Biology & Histology, University of Antwerp, Groenenborgerlaan 171 B-2020 Antwerp, Belgium
G. Van Tendeloo
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171 B-2020 Antwerp, Belgium
S. Bals*
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171 B-2020 Antwerp, Belgium
*
*Corresponding author. Email: [email protected]
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Abstract

Imaging soft matter by transmission electron microscopy (TEM) is anything but straightforward. Recently, interest has grown in developing alternative imaging modes that generate contrast without additional staining. Here, we present a dark-field TEM technique based on the use of an annular objective aperture. Our experiments demonstrate an increase in both contrast and signal-to-noise ratio in comparison to conventional bright-field TEM. The proposed technique is easy to implement and offers an alternative imaging mode to investigate soft matter.

Keywords

annular apertureelectron microscopydark fieldlow contrast materialsTEM contrast
Type
Equipment and Techniques Development: Biological
Information
Microscopy and Microanalysis , Volume 19 , Issue 3 , June 2013 , pp. 629 - 634
Copyright
Copyright © Microscopy Society of America 2013 

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