Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-29T15:32:05.216Z Has data issue: false hasContentIssue false
  • English
  • Français

Annular Dark Field Tomography in TEM

Published online by Cambridge University Press:  01 August 2005

S Bals ,
C F Kisielowski ,
M Croitoru  and
G Van Tendeloo
S Bals
Affiliation:
University of Antwerp
C F Kisielowski
Affiliation:
Lawrence Berkeley National Laboratory
M Croitoru
Affiliation:
University of Antwerp
G Van Tendeloo
Affiliation:
University of Antwerp

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 2118 - 2119
Copyright
© 2005 Microscopy Society of America