Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-27T06:31:35.219Z Has data issue: false hasContentIssue false
  • English
  • Français

Anin situMethod for Preserving Buried Voids and Cracks During TEM Sample Preparation using FIB

Published online by Cambridge University Press:  25 July 2016

X. L. Zhong ,
P.J. Withers  and
M. G. Burke
X. L. Zhong
Affiliation:
Electron Microscopy Centre and Materials Performance Centre, School of Materials, University of Manchester, Manchester M13 9PL, UK
P.J. Withers
Affiliation:
Electron Microscopy Centre and Materials Performance Centre, School of Materials, University of Manchester, Manchester M13 9PL, UK
M. G. Burke
Affiliation:
Electron Microscopy Centre and Materials Performance Centre, School of Materials, University of Manchester, Manchester M13 9PL, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 186 - 187
Copyright
© Microscopy Society of America 2016 

References

[1]. Lechne, L., Biskupek, J. & Kaiser, U. Microsc Microanal 18 (2012). p. 379–384.Google Scholar
[2]. Phaneuf, M.W. Micron 30(3 (1999). p. 277–288.Google Scholar
[3] Giannuzzi, L.A. & Stevie, F.A. Micron 30 (1999). p. 197–204.Google Scholar
[4] The authors thank Mr. Y. Fan and Dr. Z Liu for providing the composite specimens for evaluation.Google Scholar