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Anaysis of Lacbed Patterns from A Microtwin in Cobalt
Published online by Cambridge University Press: 02 July 2020
Abstract
Recently LACBED (Large Angle Convergent Beam Electron Diffraction) studies for identifying the nature of stacking faults has been reported in [1,2]. Here we report the LACBED study for a microtwin whose images are usually similar to those of an intrinsic or an extrinsic stacking faults (for this discussion, see [3]).
Observations: Thin foils of cobalt with the thickness of about 180 nm (f.c.c phase, a=0.354 nm) were examined by a Philips CM200. Fig. 1 shows strong beam dark field images of microtwins or stacking faults. Fig. 2 shows the bright field LACBED pattern taken near the area marked as a circle in fig. 1. The specimen height, from the convergent point of beams, was about 0.0586 mm and the convergent angle was 0.615 degrees.
Calculations and analysis: Analysis of fig. 1 alone indicates the encircled fault an extrinsic stacking fault.
- Type
- Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
- Information
- Copyright
- Copyright © Microscopy Society of America 2001
References
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5. This research was supported by kyungsung University research grant in 1999.Google Scholar