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Analyzing Solar Cell Material Properties with Confocal Raman Imaging

Published online by Cambridge University Press:  01 August 2010

T Dieng ,
J Yang ,
A Jauss ,
U Schmidt  and
O Hollricher
T Dieng
Affiliation:
WITec GmbH, Germany
J Yang
Affiliation:
WITec Instruments Corporation
A Jauss
Affiliation:
WITec GmbH, Germany
U Schmidt
Affiliation:
WITec GmbH, Germany
O Hollricher
Affiliation:
WITec GmbH, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1342 - 1343
Copyright
Copyright © Microscopy Society of America 2010