Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-23T10:00:36.967Z Has data issue: false hasContentIssue false
  • English
  • Français

Analytical TEM Investigations of Si Nanowires grown by the VLS Mechanism from Au Templates

Published online by Cambridge University Press:  07 September 2007

R Schneider ,
A Berger ,
S Christiansen ,
R Scholz ,
T Stelzner ,
G Andrä ,
T Seyller  and
L Ley
R Schneider
Affiliation:
University Karlsruhe and Max Planck Institute of Microstructure Physics,Germany
A Berger
Affiliation:
University Karlsruhe and Max Planck Institute of Microstructure Physics,Germany
S Christiansen
Affiliation:
Max Planck Institute of Microstructure Physics and Martin Luther University Halle-Wittenberg,Germany
R Scholz
Affiliation:
Max Planck Institute of Microstructure Physics,Germany
T Stelzner
Affiliation:
University Jena
G Andrä
Affiliation:
University Jena
T Seyller
Affiliation:
University Erlangen,Germany
L Ley
Affiliation:
University Erlangen,Germany
Get access

Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 314 - 315
Copyright
Copyright © Microscopy Society of America 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)