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Analytical STEM Study of P-Doped Silicon Nanocrystals Exhibiting Mid-Infrared Localized Surface Plasmon Resonance

Published online by Cambridge University Press:  09 October 2013

J.S. Jeong
Affiliation:
D.J. Rowe
Affiliation:
U.R. Kortshagen
Affiliation:
K.A. Mkhoyan
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013