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The Analysis of Sensitive Materials Using EBSD: The Importance of Beam Conditions and Detector Sensitivity

Published online by Cambridge University Press:  05 August 2019

Pat Trimby ,
Angus Bewick ,
Daniel Abou-Ras ,
Pietro Caprioglio ,
Dieter Neher  and
Laura Otter
Pat Trimby*
Affiliation:
Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, UK.
Angus Bewick
Affiliation:
Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, UK.
Daniel Abou-Ras
Affiliation:
Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, Germany.
Pietro Caprioglio
Affiliation:
Institut für Physik und Astronomie, Universität Potsdam, Potsdam-Golm, Germany.
Dieter Neher
Affiliation:
Institut für Physik und Astronomie, Universität Potsdam, Potsdam-Golm, Germany.
Laura Otter
Affiliation:
Department of Earth & Planetary Science, Macquarie University, Sydney, Australia.
*
*Corresponding author: [email protected]

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2394 - 2395
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Jeon, NJ et al. , Nature 517 (2015), p. 476.Google Scholar
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[3]Abbasi, K et al. , Microscopy & Microanalysis 24 (2018), p. 420.Google Scholar
[4]Jiang, C and Zhang, P, J. Appl. Phys 123 (2018), p. 083105.Google Scholar
[5]US Patent US8890065B2: Apparatus and method for performing microdiffraction analysis.Google Scholar
[6]Vespucci, S et al. , Physical Review B 92 (2015), p. 205301.Google Scholar