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Analysis of Multiple-ion Events in Atom Probe Tomography Studies of MoNbTi and HfNbTaTiZr Refractory High Entropy Alloys

Published online by Cambridge University Press:  22 July 2022

Patrick G. Callahan ,
Keith E. Knipling  and
D. Beaudry
Patrick G. Callahan*
Affiliation:
Materials Science and Technology Division, US Naval Research Laboratory, Washington, DC, USA
Keith E. Knipling
Affiliation:
Materials Science and Technology Division, US Naval Research Laboratory, Washington, DC, USA
D. Beaudry
Affiliation:
Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, MD, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Expanding the Limits of Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 702 - 703
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Copyright
Copyright © Microscopy Society of America 2022

References

Wang, F et al. , Science 370 (2020), p. 95. doi: 10.1126/science.aba3722CrossRefGoogle Scholar
Larson, DJ et al. in “Local Electrode Atom Probe Tomography A User's Guide”, (Springer, New York).Google Scholar
Saxey, DW, Ultramicroscopy 111 (2020), p. 473. doi: 10.1016/j.ultramic.2010.11.021CrossRefGoogle Scholar