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Analysis of Local Texture across Layers in Electron-Beam Melted (EBM) Ti-6Al- 4V via Electron Backscatter Diffraction (EBSD)

Published online by Cambridge University Press:  01 August 2010

B Saller ,
JR Porter ,
T Van Den Vlekkert  and
SD Walck
B Saller
Affiliation:
University of California, Irvine
JR Porter
Affiliation:
University of California, Irvine
T Van Den Vlekkert
Affiliation:
University of California, Irvine
SD Walck
Affiliation:
South Bay Technology Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 702 - 703
Copyright
Copyright © Microscopy Society of America 2010